Transmission electron microscopy (TEM) of naturally shocked SiO2 from Meteor Crater, Arizona [abs.]
Kieffer, S.W., Phakey, P.P., and Christie, J.M., 1972, Transmission electron microscopy (TEM) of naturally shocked SiO2 from Meteor Crater, Arizona [abs.]: Eos, Transactions, American Geophysical Union, v. 53, p. 1121.
Authors
Kieffer, S.W., Phakey, P.P., and Christie, J.M.
Publication Date
1972
Citation
Eos, Transactions, American Geophysical Union, v. 53, p. 1121.
